Matthias Bittner is a senior data scientist at StatSoft specializing in the use of software tools like Spotfire and Statistica in industries like semiconductor manufacturing and pharmaceutical production. He has been working with data science tools for over six years, helping clients to benefit from analytical automation through know-how transfer and development of solutions based on individual requirements. With his expertise, Matthias is able to provide valuable insights and solutions to complex analytical challenges faced by StatSoft's clients.
One of the most important tasks in semiconductor manufacturing: identifying and analyzing defect patterns on wafers. This is exactly where the Wafer Map developed by StatSoft comes in.
Spotfire version 14.5 is released and this innovation release comes with a lot of interesting features.