Design of Experiments with Statistics - Part 1 (DOE1)

Target:
The aim of this product course is to familiarize students with the tools of the Statistica data analysis package offered in the Design of Experiments module. Participants should become familiar with the program interface­and control the result output by selecting special options and buttons in the corresponding dialog interfaces.

Target group:
This course is aimed at professionals in industrial companies who want to use Dell Statistica software to implement simple statistical design procedures in research and development or quality assurance.

Course contents:
This course for participants with basic knowledge of Design of Experiments (DoE) provides an introduction to planning and evaluating test series with Statistica Professional. The topics:

  • Complete and fractional plans for two-stage factors
  • Screening plans for two-step factors
  • Designs for quadratic factor effects
  • Optimization of a target quantity with efficacy profiles
  • Plans with star points (Central Composite Designs)
  • Latin squares

The training consists of a short explanation of the mentioned procedures and the independent training of the course participants in the context of exercises. Examples in our standard courses are generally understandable data sets from different application areas.

Prerequisites:
This course presupposes programme knowledge from "Statistica Introduction" (STE) and basic knowledge in statistical design of experiments. In order to fully benefit from the training, participants should also have basic knowledge of variance and regression analysis.

Supplementary courses:
For participants without sufficient previous knowledge we offer our method courses "Introduction to Statistics" (STA1) and "Introduction to Statistical Design of Experiments" (VPL1). Further product courses are "Linear Models" (STA2) "Advanced Design of Experiments" (VPL2) or "Design of Experiments with Statistics - Part 2" (DOE2).

Duration: 2 days Time: 9:30 - 17:00 hrs        

 

Register

 

back to overview