Smarter Semiconductor Manufacturing – with Analytics for Engineers and Fab Managers

In semi­con­duc­tor manu­fac­tu­ring, every detail counts. Whe­ther pro­cess engi­neer, yield engi­neer, test engi­neer, or fab mana­ger – all face the same chal­lenges: kee­ping equip­ment sta­ble, mini­mi­zing defects, ensu­ring con­sis­tent qua­li­ty, and opti­mi­zing yield.

Stat­Soft pro­vi­des the right tools and ana­ly­ses for you.

Process and Equipment Engineers

Pro­cess and machi­ne data are gene­ra­ted every second – from tem­pe­ra­tu­re cur­ves and pres­su­re pro­files to gas flow mea­su­re­ments. With Stat­Soft, the­se data streams can be moni­to­red in real time and asses­sed through sta­tis­ti­cal pro­cess con­trol (SPC), mul­ti­va­ria­te ana­ly­ses, and trend models. Devia­ti­ons from tar­get con­di­ti­ons are imme­dia­te­ly detec­ted. In addi­ti­on, com­plex rela­ti­onships bet­ween para­me­ters and defect rates can be mode­led using Design of Expe­ri­ments (DoE) or regres­si­on tech­ni­ques.

The result: sta­ble pro­ces­ses, fewer down­ti­mes, and tar­ge­ted opti­miza­ti­on of indi­vi­du­al pro­cess modu­les.

Yield and Defect Engineers

Yield engi­neers are con­stant­ly stri­ving to detect the smal­lest devia­ti­ons in the pro­duc­tion flow befo­re they lead to signi­fi­cant yield los­ses. Inter­ac­ti­ve wafer maps make defect pat­terns (e.g., scrat­ches, par­tic­le dis­tri­bu­ti­ons, hot spots) imme­dia­te­ly visi­ble. Sta­tis­ti­cal clus­te­ring methods and image ana­ly­ses help unco­ver spa­ti­al and tem­po­ral pat­terns and iden­ti­fy pro­cess steps with increased defect rates. Drill-down ana­ly­ses also enable seam­less navi­ga­ti­on from a fab-wide over­view down to indi­vi­du­al lay­ers or lots.

Test and Product Engineers

Test data is gene­ra­ted in huge volu­mes – from para­me­tric tests and Shmoo plots to relia­bi­li­ty test­ing. With Stat­Soft, this data can be auto­ma­ti­cal­ly aggre­ga­ted, visua­li­zed, and exami­ned using hypo­the­sis test­ing or machi­ne lear­ning models for sys­te­ma­tic issues. Typi­cal ques­ti­ons include:

  • Which test para­me­ters have the grea­test impact on per­for­mance?
  • Which com­bi­na­ti­ons lead to fail­ures?
  • Which tests can be redu­ced or auto­ma­ted wit­hout incre­asing risk?

This redu­ces test time while impro­ving pro­duct qua­li­ty.

Data Scientists

Modern analytics requi­res fle­xi­bi­li­ty. Stat­Soft allows direct inte­gra­ti­on of R and Python scripts into stan­dar­di­zed work­flows. Data sci­en­tists can deve­lop models for pre­dic­ti­ve main­ten­an­ce (e.g., equip­ment fail­ure pro­ba­bi­li­ties), yield opti­miza­ti­on (e.g., yield pre­dic­tion based on pro­cess para­me­ters), or qua­li­ty fore­cas­ting (e.g., pre­dic­ting chip per­for­mance) and embed them into inter­ac­ti­ve dash­boards. This way, not only data sci­en­tists them­sel­ves but all roles in the com­pa­ny bene­fit – with repro­du­ci­b­le, vali­da­ted ana­ly­ti­cal pro­ce­du­res.

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What makes Stat­Soft uni­que:

Our con­sul­tants sup­port com­pa­nies not only in imple­men­ting the soft­ware but also in metho­do­lo­gi­cal exe­cu­ti­on, employee trai­ning, and buil­ding a sus­tainable analytics archi­tec­tu­re. As a result, ana­ly­ses don’t remain one-off pro­jects but beco­me a per­ma­nent part of a suc­cessful pro­duc­tion stra­tegy.

With Stat­Soft, semi­con­duc­tor com­pa­nies com­bi­ne exper­ti­se, tech­no­lo­gy, and data-dri­ven inno­va­ti­on – achie­ving hig­her effi­ci­en­cy, bet­ter qua­li­ty, and long-term busi­ness suc­cess.

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If you have any ques­ti­ons about our pro­ducts or need advice, plea­se do not hesi­ta­te to cont­act us direct­ly.

Tel.: +49 40 22 85 900-0
E-mail: info@statsoft.de

Gui­do Band­holz (Head of Sales)