Spotfire 15 Release

What is New in Spotfire 15 – A Comprehensive Overview

With Spot­fi­re 15, the plat­form takes a clear step for­ward in its evo­lu­ti­on toward an AI aug­men­ted, indus­try nati­ve analytics envi­ron­ment. Rather than adding iso­la­ted fea­tures, this release res­ha­pes how domain experts inves­ti­ga­te com­plex ope­ra­tio­nal sys­tems across data, work­flows, and enti­re indus­tries. The gui­ding idea is straight­for­ward: acce­le­ra­te and gui­de inves­ti­ga­ti­on with AI, while kee­ping the expert firm­ly in con­trol and groun­ding every result in trus­ted, indus­try stan­dard methods.

Four deve­lo­p­ments stand out as the head­line the­mes of this release: AI aug­men­ted inves­ti­ga­ti­on with indus­try nati­ve agents, push com­pu­te analytics that run whe­re the data lives, a tight­ly inte­gra­ted ana­ly­ti­cal sys­tem that uni­fies visu­al, sta­tis­ti­cal, and model dri­ven ana­ly­sis, and expan­ded spa­ti­al capa­bi­li­ties for microelec­tro­nic, geos­pa­ti­al, and sub­sur­face use cases.

Below is a detail­ed sum­ma­ry of the most important inno­va­tions in Spot­fi­re 15.

AI Augmentation

The cen­tral the­me of Spot­fi­re 15 is the move to an AI aug­men­ted plat­form. AI acce­le­ra­tes and gui­des inves­ti­ga­ti­on, hel­ping experts move fas­ter from data to insight wit­hout repla­cing their exper­ti­se. The empha­sis is on trans­pa­ren­cy and con­trol rather than auto­ma­ti­on for its own sake.

Visual AI in Context

Spot­fi­re sur­faces explainable insights that you can see, explo­re, and vali­da­te within a trus­ted envi­ron­ment, always in con­text. Ins­tead of retur­ning ans­wers that have to be taken on faith, the plat­form high­lights pat­terns, anoma­lies, and rela­ti­onships direct­ly within the acti­ve visua­liza­ti­on, so fin­dings can be che­cked against the under­ly­ing data.

Expert in the Loop

Every recom­men­da­ti­on can be accept­ed, fine tun­ed, or igno­red. This ensu­res full con­trol, trust, and ana­ly­ti­cal lineage. The per­son doing the ana­ly­sis deci­des what to act on, and each step remains traceable, which is essen­ti­al in regu­la­ted and qua­li­ty dri­ven envi­ron­ments.

Inside Agents (Industry Native Agents)

The con­text awa­re recom­men­da­ti­ons that com­bi­ne AI, domain exper­ti­se, and indus­try stan­dard ana­ly­ti­cal methods are powered by Insight Agents. Orga­niza­ti­ons can go fur­ther with Cus­tom Insight Agents, enco­ding their own insti­tu­tio­nal know­ledge into the same trus­ted AI expe­ri­ence, mana­ged cen­tral­ly via the Agent Regis­try.

Cen­tra­li­zed gover­nan­ce over LLM end­points, ensu­res pri­va­cy, secu­ri­ty, and audi­ta­bi­li­ty, with model end­points mana­ged and con­fi­gu­red cen­tral­ly, inclu­ding the choice of pro­vi­der and authen­ti­ca­ti­on.

Push Compute Analytics

Spot­fi­re 15 can exe­cu­te analytics within modern data plat­forms (start­ing with dat­ab­ricks and Snow­fla­ke), enab­ling lar­ge sca­le inves­ti­ga­ti­on whe­re the data lives.

  • Visu­al, sta­tis­ti­cal, and model dri­ven analytics can be run direct­ly in dis­tri­bu­ted data envi­ron­ments.
  • Data can stay whe­re it resi­des and dupli­ca­ti­on of data and cos­t­ly extra­c­tion cn be avo­ided
  • Working with lar­ge data­sets beco­mes seam­less while main­tai­ning per­for­mance, secu­ri­ty, and gover­nan­ce.

Integrated Analytical System

Spot­fi­re 15 uni­fies visu­al, sta­tis­ti­cal, and model dri­ven analytics for seam­less inves­ti­ga­ti­on across data and work­flows.

The goal is to pro­vi­de a uni­fied expe­ri­ence whe­re users can move seam­less­ly bet­ween visu­al explo­ra­ti­on, sta­tis­ti­cal ana­ly­sis and model­ling within a sin­gle envi­ron­ment while having access to indus­try spe­ci­fic methods. This uni­fied expe­ri­ence encap­su­la­tes the real inves­ti­ga­ti­on pro­ces­ses rele­vant for the users.

Ensuring Statistical Trust

To enhan­ce trust in the inter­pre­ta­ti­on of visu­al ana­ly­sis Spot­fi­re 15 inte­gra­tes more and more sta­tis­ti­cal tests and algo­rith­ms:

Robust nor­ma­li­ty, group hypo­the­sis, and vari­ance checks, along with decli­ne cur­ve fit­ting and Pro­bit Plot ana­ly­sis, can be appli­ed within the acti­ve visua­liza­ti­on can­vas.

The sup­port­ed methods include estab­lished tests such as Sha­pi­ro Wilk, Ander­son Dar­ling, Kol­mo­go­rov Smirn­ov, ANOVA, Krus­kal Wal­lis, the Stu­dent t test, Leve­ne, and Brown For­sy­the, along­side mea­su­res like skew­ness and kur­to­sis and tech­ni­ques such as Par­ti­al Least Squa­res, Las­so, line­ar and logi­stic regres­si­on, and spar­se data fil­te­ring.

AI Guided Statistical Testing

A Sta­tis­ti­cal Test Advi­sor agent eva­lua­tes the data dis­tri­bu­ti­on and gui­des engi­neers toward sound ana­ly­ti­cal methods. For exam­p­le, it can recom­mend the appro­pria­te test for a sel­ec­ted cate­go­ry and explain why, hel­ping less expe­ri­en­ced users avo­id com­mon sta­tis­ti­cal pit­falls. This capa­bi­li­ty is plan­ned for release this sum­mer.

Industry Native Workflows

Spot­fi­re 15 deli­vers indus­try spe­ci­fic func­tion­a­li­ty that acce­le­ra­tes ana­ly­ti­cal pro­ces­ses for cus­to­mers in the­se fields:

  • Built in domain spe­ci­fic work­flows that reflect how engi­neers and domain experts inves­ti­ga­te pro­blems in prac­ti­ce.
  • Nati­ve sup­port for indus­try data sources, for­mats, and struc­tures across sys­tems and envi­ron­ments.
  • Spe­cia­li­zed visua­liza­ti­ons and ana­ly­ti­cal methods tail­o­red to indus­try use cases and stan­dards, inclu­ding dedi­ca­ted wafer cen­tric and mul­ti lay­er ana­ly­ses.

Handling Spatial and Time Series Data

Spot­fi­re 15 pro­vi­des impro­ve­ments for spa­ti­al data ana­ly­sis geo­me­tric, geo­gra­phi­cal, and sub­sur­face sce­na­ri­os.

  • Wafer map visua­liza­ti­on for mul­ti lay­er semi­con­duc­tor yield, defect, and pro­cess ana­ly­sis, which is direct­ly rele­vant to semi­con­duc­tor manu­fac­tu­ring use cases.
  • Advan­ced geos­pa­ti­al algo­rith­ms to auto­ma­te STOIIP con­tou­ring, well den­si­ty track­ing, and mani­fold ser­vice area buf­fe­ring.
  • Decou­pled 2D and 3D lay­ers for inde­pen­dent well­bo­re tra­jec­to­ry, for­ma­ti­on mode­ling, and hig­her per­for­mance well logs for sub­sur­face engi­nee­ring.

For time series data, Spot­fi­re 15 brings sub­stan­ti­al impro­ve­ments to aqui­ring data, navi­ga­ting and sel­ec­ting time series, and the capa­bi­li­ty to over­lay addi­tio­nal infor­ma­ti­on:

  • Data His­to­ri­an con­nec­tors enable navi­ga­ting asset hier­ar­chies and tag archi­ves to access ope­ra­tio­nal data.
  • Ran­ge sel­ec­tion mecha­nisms have been refi­ned to enhan­ce inves­ti­ga­ti­ons.
  • Tem­po­ral axis are easier to drill-down due to a smar­ter re-label­ling of time points.
  • Refe­rence lay­ers are more fle­xi­ble to over­lay con­trol limits and pro­cess sta­tes.

Conclusion

Spot­fi­re 15 is a sub­stan­ti­al, for­ward loo­king release that reframes the plat­form as an AI aug­men­ted, indus­try nati­ve analytics envi­ron­ment. From AI gui­ded inves­ti­ga­ti­on with gover­ned indus­tri­al agents and push com­pu­te analytics, to a tight­ly inte­gra­ted ana­ly­ti­cal sys­tem, rigo­rous inline sta­tis­ti­cal vali­da­ti­on, and expan­ded spa­ti­al capa­bi­li­ties, the update signi­fi­cant­ly broa­dens what users can accom­plish wit­hout lea­ving the plat­form.

For Stat­Soft cus­to­mers, par­ti­cu­lar­ly tho­se in semi­con­duc­tor manu­fac­tu­ring and other qua­li­ty dri­ven indus­tries, Spot­fi­re 15 com­bi­nes grea­ter ana­ly­ti­cal power with the con­trol, trans­pa­ren­cy, and gover­nan­ce the­se envi­ron­ments requi­re. As always, we are hap­py to dis­cuss how the new capa­bi­li­ties app­ly to your spe­ci­fic work­flows.

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Gui­do Band­holz (Head of Sales)